Degradations of semicondactor devices under pulsed heat overloading
Завантаження...
Дата
2000
Автори
Chumakov, V. I.
Назва журналу
ISSN журналу
Назва тому
Видавець
Анотація
The linear heat model of degradations of semiconductor devices under pulsed electric overloading has
been constructed. Expressions for temporal depende
ncies of the temperature under different forms of pulse of
current are obtained
Опис
References:
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Ключові слова
DEGRADATIONS, SEMICONDUCTOR DEVICES, PULSED HEAT OVERLOADING