Розрахунок параметрів надійності складних систем методом логіко-імовірнісного моделювання

Abstract

Today we are witnessing the widespread development of microelectromechanical systems (MEMS), the short name is microsystems. This industry is leading to its increasing use. Examples include: portable computer technology, automotive, smartphones, digital cameras, security systems and many other industries. One of the many problems facing developers of such microsystems is the problem of MEMS survivability, that is, the problem of predicting their behavior and predicting possible states of the system. So now the problem of system modeling is at the forefront.