Условия формирования алгоритма on-line обработки сигналов СВЧ сенсора на основе его аналитической модели

Abstract

Modern microcontrollers allow us to solve many problems that take measuring instruments to a new qualitative level. This primarily applies to indirect meters. A special place is occupied by the tasks of developing new devices for non-destructive testing. This applies to measuring the parameters of materials at the time of technological impact or immediately after it. A noticeable change in the electrophysical properties of many substances manifests itself in the microwave range, since there are relaxation frequencies of their molecules. The use of microwave as the operating frequencies of the meters can provide the greatest information content of the measuring signals generated in the sensor.