Публікація: Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing
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Дата
2008
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Анотація
A method, which allows decreasing calculations works labour intensiveness at the choice of paret-optimum tests for semiconductors storage devices diagnosing is offered. This method is realized in the program Optimal-test, which allows decreasing the duration of memory’s microcircuits testing without worsening of their quality.
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Ключові слова
diagnosing, microcircuit, memory