Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing

Публікація:
Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing

dc.contributor.author	Ryabtsev, V. G.
dc.contributor.author	Almadi M. K.
dc.date.accessioned	2016-09-05T08:37:52Z
dc.date.available	2016-09-05T08:37:52Z
dc.date.issued	2008
dc.description.abstract	A method, which allows decreasing calculations works labour intensiveness at the choice of paret-optimum tests for semiconductors storage devices diagnosing is offered. This method is realized in the program Optimal-test, which allows decreasing the duration of memory’s microcircuits testing without worsening of their quality.	uk_UA
dc.identifier.uri	http://openarchive.nure.ua/handle/document/2072
dc.language.iso	en	uk_UA
dc.publisher	ХНУРЭ	uk_UA
dc.subject	diagnosing	uk_UA
dc.subject	microcircuit	uk_UA
dc.subject	memory	uk_UA
dc.title	Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing	uk_UA
dc.type	Article	uk_UA
dspace.entity.type	Publication