Please use this identifier to cite or link to this item: http://openarchive.nure.ua/handle/document/2072
Title: Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing
Authors: Ryabtsev, V. G.
Almadi, M. K.
Keywords: diagnosing
microcircuit
memory
Issue Date: 2008
Publisher: ХНУРЭ
Abstract: A method, which allows decreasing calculations works labour intensiveness at the choice of paret-optimum tests for semiconductors storage devices diagnosing is offered. This method is realized in the program Optimal-test, which allows decreasing the duration of memory’s microcircuits testing without worsening of their quality.
URI: http://openarchive.nure.ua/handle/document/2072
Appears in Collections:Радиоэлектроника и информатика

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