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|Title:||Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing|
|Authors:||Ryabtsev, V. G.|
Almadi, M. K.
|Abstract:||A method, which allows decreasing calculations works labour intensiveness at the choice of paret-optimum tests for semiconductors storage devices diagnosing is offered. This method is realized in the program Optimal-test, which allows decreasing the duration of memory’s microcircuits testing without worsening of their quality.|
|Appears in Collections:||Радиоэлектроника и информатика|
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