Emi sources from microwave electron device

Публікація:
Emi sources from microwave electron device

dc.contributor.author	Nikitenko, A. N.
dc.contributor.author	Vasyanovich, A. V.
dc.date.accessioned	2019-05-23T19:02:37Z
dc.date.available	2019-05-23T19:02:37Z
dc.date.issued	1996
dc.description.abstract	Theoretical and experimental studies of spurious in crossed-field devices is described. Ions of residual gases in vacuum tubes are responsible for oscillations. These oscillations affect the electromagnetic oscillation in those tubes. Thus both the breadth and the concentration of output spectrum from crossed-field devices take place.The theoretical study was proved by experimental tests.	uk_UA
dc.identifier.citation	Nikitenko A. N. Emi sources from microwave electron device / A. N. Nikitenko, A. V.Vasyanovich // INTERNATION WROCLAW SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - 1996 - pp. 463-466.	uk_UA
dc.identifier.uri	http://openarchive.nure.ua/handle/document/8887
dc.language.iso	en	uk_UA
dc.publisher	Published by Institute of Telecommunication	uk_UA
dc.subject	crossed-field divices	uk_UA
dc.subject	experimental studies	uk_UA
dc.subject	theretical studies	uk_UA
dc.subject	oscilation	uk_UA
dc.subject	output spectrum	uk_UA
dc.title	Emi sources from microwave electron device	uk_UA
dc.type	Article	uk_UA
dspace.entity.type	Publication