Публікація: Assertions-based mechanism for the functional verification of the digital designs
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Дата
2005
Назва журналу
ISSN журналу
Назва тома
Видавництво
EWDTW
Анотація
According to [1] the verification cost of the digital devices, designed on the base of ASIC, IP-core, SoC technologies, takes up to 70% of the overall design cost. Similarly, up to 80% of the project source code implements a testbench. Reducing these two mentioned parameters minimizes timeto-market, and this is one of the main problems for the world-leading companies in the area of Electronic Design Automation (EDA). The goal of the verification tasks is to eliminate all design errors as early as possible to meet the requirements of the specification. Passing the error through the subsequent design stages (from a block to a chip, and later to a system) each time increases the cost of it’s elimination. Validation – a higher-level verification model – confirms the correctness of the project against the problems in the implementation of the major specified functionality. The goal of this paper is to noticeably decrease the verification time by extending the design with software-based redundancy – the assertions mechanism [2-5], which allows to simply analyze the major specified constraints during the device simulation process and to diagnose the errors in case of their detection. To achieve the declared goal it is necessary to solve the following problems: 1. To formalize the assertions-based product verification process model. 2. To develop the software components for synthesis and analysis of the assertions for the functionality, blocks and the entire system. 3. To get experimental confirmation of the benefits from using assertions to reduce time-to-market or, in other words, to noticeably reduce verification and overall design time.
Опис
Ключові слова
verification, validation, assertion engine, PSL
Бібліографічний опис
Vladimir Hahanov Assertions-based mechanism for the functional verification of the digital designs/ Vladimir Hahanov, Oleksandr Yegorov, Sergiy Zaychenko, Alexander Parfentiy, Maryna Kaminska, Anna Kiyaschenko //Proceedings of IEEE East-West Design & Test Workshop (EWDTW’05)