Публікація: Automated nondestroying roughness control on optical ferrule surfaces
dc.contributor.author | Токарев, В. В. | |
dc.contributor.author | Невлюдов, И. Ш. | |
dc.contributor.author | Цимбал, А. М. | |
dc.date.accessioned | 2018-04-02T17:37:53Z | |
dc.date.available | 2018-04-02T17:37:53Z | |
dc.date.issued | 2001 | |
dc.description.abstract | In the developed automated quality control system for end face of optical ferrules, a Linnik interferometer scheme, and a CCD coordinate-sensitive photo-receiver are used. There is need to fulfill the following basic requirement in an optical micro-interferometer scheme: the intensity of light flux from standard mirror is approximately equal to light flux intensity from surface of object, because that condition is necessary for interference traces observation. The MII-4 micro-interferometer is intended for end face roughness with greater coefficient of reflection (e.g. metal surfaces). | uk_UA |
dc.identifier.citation | Tokarev V. Automated nondestroying roughness control on optical ferrule surfaces / V. Tokarev, I.Sh. Nevlyudov, A.M.Tsimbal // 3d International Workshop on «Laser and Fiber-Optical Networks Modeling», May 22-24, KhTURE, Kharkiv, 2001. - P. 74-76. | uk_UA |
dc.identifier.uri | http://openarchive.nure.ua/handle/document/4560 | |
dc.language.iso | en | uk_UA |
dc.subject | nondestroying roughness control | uk_UA |
dc.title | Automated nondestroying roughness control on optical ferrule surfaces | uk_UA |
dc.type | Conference proceedings | uk_UA |
dspace.entity.type | Publication |
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