Перегляд за автором "Nevlyudov, I."
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Публікація Practical results of the study of photopolymer exposure of printed circuit board topology(ISMA, 2023) Nevlyudov, I.; Razumov-Frizyuk, E.; Nikitin, D.; Badaniuk, I.; Strelets, R.Practical results of studies of deviations of geometric dimensions of the topological structure of printed circuit boards during photopolymer 3D exposure are presented. A series of experiments of topology exposure under different process parameters was carried out. The results of 112 samples were checked using statistical analysis and a regression model of the influence of parameters on the deviation of the geometric dimensions of conductors was built.Публікація Structural diagram of automated quality control process of silicon wafers during their surface shaping(International Science Group, 2021) Nevlyudov, I.; Botsman, I.; Tesliuk, S.Currently the task of finding alternative energy sources is one of the most urgent tasks not only in Ukraine, but throughout the world. In Ukraine several types of energy production from renewable sources are used, but recently, special attention is paid to solar power plants. Monocrystalline and polycrystalline silicon wafers for solar panels are used as solar cells. As solar cells for solar panels the monocrystalline and polycrystalline silicon wafers are used.Публікація Structured Language SQL Parametric Model Development(2016) Nevlyudov, I.; Miliutina, S.; Yevsieiev, V.Публікація Systemological method of forecasting the electronic modules parameters(Primedia eLaunch & European Scientific Platform, 2021) Nevlyudov, I.; Botsman, I.; Nevliudova, V.A systematic approach to the electronic modules design allows a comprehensive solving the problem of ensuring their quality at various stages of the life cycle. Thus, one of the methods for predicting the EM state at a certain stage of its operation can be implemented on the systemological approach basis. This approach makes it possible to present the EM state at each moment of time as a set of its most significant operational parameters and to build a model for displaying their changes in order to prevent possible module failures in advance when these parameters reach some critical values. Research results.Публікація Technological Process Identification Method for Accelerometers MEMS(Technological Process Identification Method for Accelerometers MEMS / I. Nevlyudov, V. Yevsieiev, S. Miliutina, V. Bortnikova // CAD in Machinery Design Implementation and Educational Issues : proceedings of the XXIV International Ukrainian-Polish Conference (CADMD' 2016), Lviv, Ukraine, October 21-22, 2016. - Lviv : Lviv Polytechnic National University, 2016. - P. 23-24. , 2016) Nevlyudov, I.; Yevsieiev, V.; Miliutina, S.; Bortnikova, V.Proposed accelerometers production technological process identification method allows to simplify a technological process choice for accelerometers MEMS design.