Please use this identifier to cite or link to this item: http://openarchive.nure.ua/handle/document/2144
Title: A Low-Cost Optimal Time SIC Pair Generator
Authors: Voyiatzis, I.
Efstathiou, C.
Antonopoulou, H.
Keywords: stuck-open testing
delay fault testing
two-pattern testing
built-in self test
Issue Date: 2010
Publisher: ХНУРЭ
Citation: Voyiatzis, I. A Low-Cost Optimal Time SIC Pair Generator / I. Voyiatzis, H. Antonopoulou, C. Efstathiou // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2010. – Вып. 4. – С. 21-26.
Abstract: The application of Single Input Change (SIC) pairs of test patterns is very efficient for sequential, i.e. stuck-open and delay fault testing. In this paper a novel implementation for the application of SIC pairs is presented. The presented generator is optimal in time, in the sense that it generates the n-bit SIC pairs in time nu2n, i.e. equal to the theoretical minimum. Comparisons with the schemes that have been proposed in the open literature which generate SIC pairs in optimal time reveal that the proposed scheme requires less hardware overhead
URI: http://openarchive.nure.ua/handle/document/2144
Appears in Collections:Радиоэлектроника и информатика

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