Публікація: A Low-Cost Optimal Time SIC Pair Generator
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Дата
2010
Назва журналу
ISSN журналу
Назва тома
Видавництво
ХНУРЭ
Анотація
The application of Single Input Change (SIC) pairs of test patterns is very efficient for sequential, i.e. stuck-open and delay fault testing. In this paper a novel implementation for the application of SIC pairs is presented. The presented generator is optimal in time, in the sense that it generates the n-bit SIC pairs in time nu2n, i.e. equal to the theoretical minimum. Comparisons with the schemes that have been proposed in the open literature which generate SIC pairs in optimal time reveal that the proposed scheme requires less hardware overhead
Опис
Ключові слова
stuck-open testing, delay fault testing, two-pattern testing, built-in self test
Бібліографічний опис
Voyiatzis, I. A Low-Cost Optimal Time SIC Pair Generator / I. Voyiatzis, H. Antonopoulou, C. Efstathiou // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2010. – Вып. 4. – С. 21-26.