A Low-Cost Optimal Time SIC Pair Generator

Публікація:
A Low-Cost Optimal Time SIC Pair Generator

dc.contributor.author	Voyiatzis, I.
dc.contributor.author	Efstathiou, C.
dc.contributor.author	Antonopoulou, H.
dc.date.accessioned	2016-09-06T10:31:47Z
dc.date.available	2016-09-06T10:31:47Z
dc.date.issued	2010
dc.description.abstract	The application of Single Input Change (SIC) pairs of test patterns is very efficient for sequential, i.e. stuck-open and delay fault testing. In this paper a novel implementation for the application of SIC pairs is presented. The presented generator is optimal in time, in the sense that it generates the n-bit SIC pairs in time nu2n, i.e. equal to the theoretical minimum. Comparisons with the schemes that have been proposed in the open literature which generate SIC pairs in optimal time reveal that the proposed scheme requires less hardware overhead	uk_UA
dc.identifier.citation	Voyiatzis, I. A Low-Cost Optimal Time SIC Pair Generator / I. Voyiatzis, H. Antonopoulou, C. Efstathiou // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2010. – Вып. 4. – С. 21-26.	uk_UA
dc.identifier.uri	http://openarchive.nure.ua/handle/document/2144
dc.language.iso	en	uk_UA
dc.publisher	ХНУРЭ	uk_UA
dc.subject	stuck-open testing	uk_UA
dc.subject	delay fault testing	uk_UA
dc.subject	two-pattern testing	uk_UA
dc.subject	built-in self test	uk_UA
dc.title	A Low-Cost Optimal Time SIC Pair Generator	uk_UA
dc.type	Article	uk_UA
dspace.entity.type	Publication