The Essentials of Testing Digital Circuits

Публікація:
The Essentials of Testing Digital Circuits

dc.contributor.author	Ngene, C. U.
dc.date.accessioned	2016-08-17T07:31:19Z
dc.date.available	2016-08-17T07:31:19Z
dc.date.issued	2012
dc.description.abstract	Testing is an important part of digital devices development life cycle and it takes about 70% of time to market. This paper discusses the various testing concepts as it relates to digital design and how it impacts the reliability of the final product. We also show that making designs testable by using appropriate design for testability techniques considerably reduces testing time and ensures a fine-grained diagnosis of finished product. A three bit counter circuit was used to illustrate the benefits of design for testability by using scan chain methodology.	uk_UA
dc.identifier.citation	Ngene, C. U. The Essentials of Testing Digital Circuits / C. U. Ngene // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2012. – Вып. 1. – С. 22-30.	uk_UA
dc.identifier.uri	http://openarchive.nure.ua/handle/document/1818
dc.language.iso	en	uk_UA
dc.publisher	ХНУРЭ	uk_UA
dc.subject	design for testability	uk_UA
dc.subject	reliability	uk_UA
dc.subject	faults	uk_UA
dc.subject	defect level	uk_UA
dc.title	The Essentials of Testing Digital Circuits	uk_UA
dc.type	Article	uk_UA
dspace.entity.type	Publication