Please use this identifier to cite or link to this item: http://openarchive.nure.ua/handle/document/2002
Title: Metastability Testing at FPGA Circuit Design using Propagation Time Characterization
Authors: Rogina, B. M.
Škoda, P.
Skala, K.
Michieli, I.
Keywords: propagation time
testing
metastability
terms—FPGA
Issue Date: 2010
Publisher: ХНУРЭ
Citation: Metastability Testing at FPGA Circuit Design using Propagation Time Characterization / B. M. Rogina and all // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2010. – Вып. 4. – С. 4-8.
Abstract: This paper describes the measurement method and experimental technique with advanced instrumentation setup for analysing the metastability behavior and performance measurement of flip-flops used in programmable logic devices. In order to demonstrate this testing approach, the results for metastable characteristics parameters of one FPGA digital circuit fabricated commercially in 90 nm CMOS process are presented. The same test methods can also be used for evaluation of timing reliability in digital circuits as well.
URI: http://openarchive.nure.ua/handle/document/2002
Appears in Collections:Радиоэлектроника и информатика

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