Automated nondestroying roughness control on optical ferrule surfaces

Abstract

In the developed automated quality control system for end face of optical ferrules, a Linnik interferometer scheme, and a CCD coordinate-sensitive photo-receiver are used. There is need to fulfill the following basic requirement in an optical micro-interferometer scheme: the intensity of light flux from standard mirror is approximately equal to light flux intensity from surface of object, because that condition is necessary for interference traces observation. The MII-4 micro-interferometer is intended for end face roughness with greater coefficient of reflection (e.g. metal surfaces).