Ryabtsev, V. G.Almadi M. K.2016-09-052016-09-052008http://openarchive.nure.ua/handle/document/2072A method, which allows decreasing calculations works labour intensiveness at the choice of paret-optimum tests for semiconductors storage devices diagnosing is offered. This method is realized in the program Optimal-test, which allows decreasing the duration of memory’s microcircuits testing without worsening of their quality.endiagnosingmicrocircuitmemoryArticle