Nikitenko, A. N.Vasyanovich, A. V.2019-05-232019-05-231996Nikitenko A. N. Emi sources from microwave electron device / A. N. Nikitenko, A. V.Vasyanovich // INTERNATION WROCLAW SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - 1996 - pp. 463-466.http://openarchive.nure.ua/handle/document/8887Theoretical and experimental studies of spurious in crossed-field devices is described. Ions of residual gases in vacuum tubes are responsible for oscillations. These oscillations affect the electromagnetic oscillation in those tubes. Thus both the breadth and the concentration of output spectrum from crossed-field devices take place.The theoretical study was proved by experimental tests.encrossed-field divicesexperimental studiestheretical studiesoscilationoutput spectrumEmi sources from microwave electron deviceArticle