Chumakov, V. I.2018-01-252018-01-252000Chumakov V. I. Degradations of semicondactor devices under pulsed heat overloading / V. I. Chumakov // Problems of Atomic Science and Technology. - 2000. - N 3. - P. 96-98. - Series: Plasma Physics (5)http://openarchive.nure.ua/handle/document/4229The linear heat model of degradations of semiconductor devices under pulsed electric overloading has been constructed. Expressions for temporal depende ncies of the temperature under different forms of pulse of current are obtained.degradationssemicondactor devicespulsed heat overloadingArticle