Testing Challenges of SOC Hardware-Software Components

Hahanov, V. I.; Obrizan, V.; Miroshnichenko, S.; Gorobets, A.

Публікація:
Testing Challenges of SOC Hardware-Software Components

dc.contributor.author	Hahanov, V. I.
dc.contributor.author	Obrizan, V.
dc.contributor.author	Miroshnichenko, S.
dc.contributor.author	Gorobets, A.
dc.date.accessioned	2016-09-06T07:14:50Z
dc.date.available	2016-09-06T07:14:50Z
dc.date.issued	2008
dc.description.abstract	Innovative testable design technologies of hardware and software, which oriented on making graph models of SoC components for effective test development and SoC component verification, are considered. Adaptation of testing and verification methods of digital systems can bring in big financial and time dividends, when using for testable design and diagnosis of software. Consideration of the following questions can be interesting: 1. Classification of key uses of SoC testable design technologies in software testing and verification problems. 2. Universal model of hardware and software component in the form of directed register transfer and control graph, on which the testable design, test synthesis and analysis problems can be solved. 3. Metrics of testability (controllability and observability) evaluation for hardware and software by the graph register transfer and control model. The silicon chip that is basis of computers and communicators development has to be considered as the initiate kernel of new testing and verification technologies appearance in software and computer engineering. A chip is used as test area for new facilities and methods creation and testing for component routing, placement, synthesis and analysis. Technological solutions, tested by time in microelectronics, then are captured and implemented into macroelectronics (computer systems and networks). Here are some of artifacts, relating to the continuity of technological innovations development	uk_UA
dc.identifier.citation	Hahanov Vladimir Testing Challenges of SOC Hardware-Software Components /Vladimir Hahanov, Volodimir Obrizan, Sergey Miroshnichenko, Alexander Gorobets //Proceedings of IEEE East-West Design & Test Symposium (EWDTS’08)	uk_UA
dc.identifier.uri	http://openarchive.nure.ua/handle/document/2121
dc.language.iso	en	uk_UA
dc.publisher	EWDTS	uk_UA
dc.subject	testing challenges	uk_UA
dc.subject	SOC	uk_UA
dc.subject	hardware-software components	uk_UA
dc.title	Testing Challenges of SOC Hardware-Software Components	uk_UA
dc.type	Article	uk_UA
dspace.entity.type	Publication